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Category:Semiconductor device defects

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Pages in category "Semiconductor device defects"

The following 18 pages are in this category, out of 18 total. This list may not reflect recent changes.

C

  • Catastrophic optical damage
  • Conductive anodic filament
  • Current crowding
  • Current filament

E

  • Electromigration

F

  • Failure of electronic components
  • Feedback-controlled electromigration

H

  • Hot-carrier injection

L

  • Latch-up
  • List of LED failure modes

N

  • Negative-bias temperature instability

Q

  • QBD (electronics)

R

  • Radiation hardening

S

  • Stress-induced leakage current

T

  • Thermal runaway
  • Time-dependent gate oxide breakdown
  • Transistor aging

Y

  • Yield (metric)
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