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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 12:00, 10 April 2011 | 523 × 366 (12 KB) | Enaswiki | {{Information |Description ={{en|1=Schematic infrared transmission microscopy setup for wafer bond characterization.}} |Source ={{own}} |Author =Enaswiki |Date = |Permission ={{cc-by-sa-3.0-de|Fraunhofer |
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