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| Description |
English: Blade insertion between the bonded wafers showing double cantilever test (DCB) also referred to as razor blade test. |
| Source | Own work |
| Author | Fraunhofer ENAS, D. Neumann |
| Permission (Reusing this file) |
   This file is licensed under the Creative Commons Attribution-Share Alike 3.0 Germany license. Attribution: Fraunhofer ENAS
 |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 11:59, 10 April 2011 | | 612 × 251 (11 KB) | Enaswiki | {{Information |Description ={{en|1=Blade insertion between the bonded wafers showing double cantilever test (DCB) also referred to as razor blade test.}} |Source ={{own}} |Author =Enaswiki |Date = |Permission |
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